by Fulton Schools | Jan 31, 2018
The LeRoy Eyring Center For Solid State Science here at ASU allows materials characterization, including transmission electron microscopy (TEM), scanning electron microscopy (SEM) Secondary Ion Mass Spectrometry (SIMS), Atomic Force Microscopy (AFM), and X-ray...
by Fulton Schools | Jan 31, 2018
A time-resolved luminescence spectroscopy system equipped with one GaAs PMT, one InGaAs PMT, and three MCT detectors allows measurements in the wavelength range of 0.3 microns to 12 microns. The system is capable of measuring time-resolved photoluminescence and...
by Fulton Schools | Jan 31, 2018
A Fourier Transform Infrared Spectrometer (FTIR) equipped with an InGaAs detector, an InSb detector, and an MCT detector is capable of measuring transmittance and reflectance for a wavelength range of 1 to 15 micron. IR FTIP System setup diagram and...
by Fulton Schools | Jan 31, 2018
The photoluminescence setup was recently equiped with a new CCD array detector for measurements in the 200 nm to 1100 nm wavelength range, as well as an InGaAs array for measurements in the 800 nm to 1700 nm wavelength range. Four different lasers are currently used...
