General laser diode measurements such as LI, spectrum, temperature dependence, polarization, IV, etc. are done using a specially designed probe station impedance matched for short pulsed testing. Translational stages allow for precise placement of a variety of optical components for quick adaptation allowing a variety of different measurements. Available equipment includes ILX Lightwave LDP-3840 & LDP-3811 Pulsed Current Sources, ILX LDT-5810B Temperature Controller, ILX OMM-6810B Optical Multimeter with Si (400-1100 nm) & InGaAs (950-1650 nm) Power/Waveheads, Keithley 2400 Source Meter for IV, & an Ando AQ-6315 Optical Spectrum Analyzer. A cleaving station with translational stages & a diamond tip is also available for cleaving laser bars as short as 200 microns with accuracy within 10 microns.