by Fulton Schools | Jan 31, 2018
The integrating sphere collects external radiation from an optical source or device (such as a laser or a light emitting diode) usually for the purpose of flux measurement. Radiation introduced into an integrating sphere is dispersed very uniformly at the sphere...
by Fulton Schools | Jan 31, 2018
A time-resolved luminescence spectroscopy system equipped with one GaAs PMT, one InGaAs PMT, and three MCT detectors allows measurements in the wavelength range of 0.3 microns to 12 microns. The system is capable of measuring time-resolved photoluminescence and...
by Fulton Schools | Jan 31, 2018
A TTP4 cryogenic manipulated-proble station is used for non-destructive electrical testing of devices on full and partial wafers up to 2 inches in diameter. Cryogenic operation is based on a continuous-tranfer cryogenic refrigerator specifically for the TTP. The...
by Fulton Schools | Jan 31, 2018
The high-speed lab is equipped with a probe station comprised of high-speed probes and detectors (25 GHz), electrical sources (3 GHz), a sampling oscilloscope, a network analyzer and a light-wave signal analyzer. These allow testing of devices for high speed...
by Fulton Schools | Jan 31, 2018
General laser diode measurements such as LI, spectrum, temperature dependence, polarization, IV, etc. are done using a specially designed probe station impedance matched for short pulsed testing. Translational stages allow for precise placement of a variety of optical...
